Range profiles of 6–16‐keV hydrogen ions implanted in metal oxides
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.322791
Reference15 articles.
1. A NEW utilization of11B ion beams: Hydrogen analysis by1H11B,α)α α nuclear reaction
2. A technique for measuring hydrogen concentration versus depth in solid samples
3. The Migration of Metal and Oxygen during Anodic Film Formation
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