Bayesian inference in band excitation scanning probe microscopy for optimal dynamic model selection in imaging-Reference-Cited by-同舟云学术

Bayesian inference in band excitation scanning probe microscopy for optimal dynamic model selection in imaging

Published:2020-08-07 Issue:5 Volume:128 Page:054105
ISSN:0021-8979
Container-title:Journal of Applied Physics
language:en
Short-container-title:Journal of Applied Physics

Author:

Vasudevan Rama K.¹^ORCID,Kelley Kyle P.¹^ORCID,Eliseev Eugene²^ORCID,Jesse Stephen¹,Funakubo Hiroshi³^ORCID,Morozovska Anna⁴^ORCID,Kalinin Sergei V.¹^ORCID

Affiliation:

1. The Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

2. Institute for Problems of Materials Science, National Academy of Sciences of Ukraine, Krjijanovskogo 3, 03142 Kyiv, Ukraine

3. Department of Materials Science and Engineering, Tokyo Institute of Technology, Yokohama 226-8502, Japan

4. Institute of Physics, National Academy of Sciences of Ukraine, 46, pr. Nauky, 03028 Kyiv, Ukraine

Funder

U.S. Department of Energy

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/am-pdf/10.1063/5.0005323

Reference71 articles.

1. How the doors to the nanoworld were opened

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4. Cold-atom scanning probe microscopy

5. Positioning single atoms with a scanning tunnelling microscope

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