Application of low-temperature scanning electron microscopy to superconductors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Reference24 articles.
1. J. I. Goldstein and H. Yakowitz,Practical Scanning Electron Microscopy(Plenum, New York, 1975);
2. C. W. Oatley,The Scanning Electron Microscope(Cambridge U.P., Cambridge, 1972);
3. O. C. Wells,Scanning Electron Microscopy(McGraw-Hill, New York, 1974).
4. Two-dimensional imaging of the resistive voltage changes in a superconductor caused by irradiation with an electron beam
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