Thermal depth profiling of materials for defect detection using hot disk technique-Reference-Cited by-同舟云学术

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Thermal depth profiling of materials for defect detection using hot disk technique

Published:2016-08 Issue:8 Volume:6 Page:085217
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Mihiretie B. M.¹^ORCID,Cederkrantz D.²,Sundin M.³,Rosén A.³,Otterberg H.²,Hinton Å.⁴^ORCID,Berg B.⁴,Karlsteen M.¹^ORCID

Affiliation:

1. Department of Physics, Chalmers University of Technology, SE-41296 Gothenburg, Sweden

2. Hot Disk AB, SE-41288 Gothenburg, Sweden

3. Department of Physics, Gothenburg University, SE-41296 Gothenburg, Sweden

4. Ale Animal Clinic, SE-449 34 Ale, Sweden

Funder

Chalmers Area of Advance, Materials Science

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4961879

Reference16 articles.

1. Thermal Tomographic Detection of Inhomogeneities

2. Noncontact thermal‐wave imaging of subsurface structure with infrared detection

3. Thermal-Wave Imaging

4. Thermal‐wave depth profiling: Theory

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3. Characteristics of thermophysical parameters in the Wugongshan area of South China and their insights for geothermal genesis;Frontiers in Environmental Science;2023-04-18

4. Improved Bayesian Optimization Framework for Inverse Thermal Conductivity Based on Transient Plane Source Method;Entropy;2023-03-27

5. ENHANCING THERMAL CHARACTERIZATION WITH TPS METHOD: A STUDY OF SPECIFIC HEAT CAPACITY AND ANISOTROPIC HEAT FLOW USING FEM;Proceeding of International Heat Transfer Conference 17;2023

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