Ballistic-electron-emission-spectroscopy detection of monolayer thickness fluctuations in a semiconductor heterostructure
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.124349
Reference9 articles.
1. Direct investigation of subsurface interface electronic structure by ballistic-electron-emission microscopy
2. Ballistic-Electron-Emission Microscopy: A Nanometer-Scale Probe of Interfaces and Carrier Transport
3. Direct Observation of Quasi-Bound States and Band-Structure Effects in a Double Barrier Resonant Tunneling Structure Using Ballistic Electron Emission Microscopy
4. Measurement of the zero-bias electron transmittance as a function of energy for half- and quarter-electron-wavelength semiconductor quantum-interference filters
5. Electron refraction in ballistic electron-emission microscopy studied by a superlattice energy filter
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1. UNCD electron emitters using Si nanostructure as a template;Vacuum;2009-08
2. BEEM imaging and spectroscopy of buried structures in semiconductors;Physics Reports;2001-08
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