Characterization of the electrical contact between a conductive atomic force microscope cantilever and a carbon nanotube
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3626811
Reference31 articles.
1. Nonlinear Resistance versus Length in Single-Walled Carbon Nanotubes
2. Electrical Nanoprobing of Semiconducting Carbon Nanotubes Using an Atomic Force Microscope
3. Electron−Phonon Scattering in Metallic Single-Walled Carbon Nanotubes
4. Tuning the conductance of single-walled carbon nanotubes by ion irradiation in the Anderson localization regime
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3. Ferroelastically protected polarization switching pathways to control electrical conductivity in strain-graded ferroelectric nanoplates;Physical Review Materials;2018-08-27
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