Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films-Reference-Cited by-同舟云学术

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Origin of thickness dependence of structural phase transition temperatures in highly strained BiFeO3 thin films

Published:2016-03 Issue:3 Volume:4 Page:036106
ISSN:2166-532X
Container-title:APL Materials
language:en
Short-container-title:APL Materials

Author:

Yang Yongsoo¹,Beekman Christianne²,Siemons Wolter²,Schlepütz Christian M.³,Senabulya Nancy¹,Clarke Roy¹,Christen Hans M.⁴

Affiliation:

1. Department of Physics, University of Michigan, Ann Arbor, Michigan 48109, USA

2. Materials Science and Technology Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

3. X-Ray Science Division, Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439, USA

4. Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831, USA

Funder

U.S. Department of Energy, Materials Sciences and Engineering Division

U.S. Department of Energy (DOE)

Publisher

AIP Publishing

Subject

General Engineering,General Materials Science

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4944749

Reference42 articles.

1. Size effects in nanostructured ferroelectrics

2. Dimension and Size Effects in Ferroelectrics

3. Landau theory of second-order phase transitions in ferroelectric films

4. X-Ray Diffraction Measurement of the Effect of Layer Thickness on the Ferroelectric Transition in EpitaxialKTaO3/KNbO3Multilayers

5. Landau theory of phase transitions in thick films

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3. Investigation of Phase Transitions in Ferromagnetic Nanofilms on a Non-Magnetic Substrate by Computer Simulation;Materials;2022-03-24

4. Strain engineering of epitaxial oxide heterostructures beyond substrate limitations;Matter;2021-04

5. The role of intermediate S-polymorph towards high piezoelectricity in La-doped BiFeO3 epitaxial thin films;Acta Materialia;2021-04

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