Oblique incidence ultrasonic reflectometry device based on c-axis tilted ScAlN films for evaluating viscoelastic properties of liquids above 100 MHz

Author:

Kinoshita Sarina12,Yanagitani Takahiko1234ORCID

Affiliation:

1. Graduate School of Advanced Science and Engineering, Waseda University, Tokyo 169-8555, Japan

2. Kagami Memorial Research Institute for Material Science and Technology, Waseda University, Tokyo 169-0051, Japan

3. JST CREST, Saitama 332-0012, Japan

4. JST FOREST, Saitama 332-0012, Japan

Abstract

The ultrasonic complex reflectometry is a powerful tool for evaluating the viscoelastic properties of small liquid samples. However, the shear mode reflectometry device has not been used at frequencies above 100 MHz because shear-mode piezoelectric films are difficult to obtain at such frequencies. Here, the oblique incidence reflectometry with 143 MHz quasi-shear waves excited by c-axis tilted ScAlN thin films was proposed to realize high-sensitivity evaluation of the viscoelastic properties of liquids. Using the prism type reflectometry MEMS, the shear elasticity and shear viscosity of glycerin solutions were estimated from their complex reflection coefficients.

Funder

Core Research for Evolutional Science and Technology

Fusion Oriented REsearch for disruptive Science and Technology

Japan Society for the Promotion of Science

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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