In situ electrical resistivity measurements of vanadium thin films performed in vacuum during different annealing cycles
Author:
Funder
Region of Franche-Comté in cooperation with the Labex ACTION program
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4974847
Reference36 articles.
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5. Stoichiometric vanadium oxides studied by XPS
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