Accurate measurement of in-plane thermal conductivity of layered materials without metal film transducer using frequency domain thermoreflectance
Author:
Affiliation:
1. Department of Mechanical Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
Funder
National Science Foundation
Multidisciplinary University Research Initiative
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/am-pdf/10.1063/5.0003770
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