Toward ultrafast magnetic depth profiling using time-resolved x-ray resonant magnetic reflectivity-Reference-Cited by-同舟云学术

Toward ultrafast magnetic depth profiling using time-resolved x-ray resonant magnetic reflectivity

Published:2021-05 Issue:3 Volume:8 Page:034305
ISSN:2329-7778
Container-title:Structural Dynamics
language:en
Short-container-title:Structural Dynamics

Author:

Chardonnet Valentin¹^ORCID,Hennes Marcel¹^ORCID,Jarrier Romain¹,Delaunay Renaud¹,Jaouen Nicolas²^ORCID,Kuhlmann Marion³,Ekanayake Nagitha³^ORCID,Léveillé Cyril²,von Korff Schmising Clemens⁴^ORCID,Schick Daniel⁴^ORCID,Yao Kelvin⁴,Liu Xuan²,Chiuzbăian Gheorghe S.¹^ORCID,Lüning Jan⁵,Vodungbo Boris¹^ORCID,Jal Emmanuelle¹^ORCID

Affiliation:

1. Sorbonne Université, CNRS, Laboratoire de Chimie Physique-Matière et Rayonnement, 75005 Paris, France

2. Synchrotron SOLEIL, L'Orme des Merisiers, Saint-Aubin, B.P. 48, 91192 Gif-sur-Yvette, France

3. Deutsches Elektronen-Synchrotron, 22607 Hamburg, Germany

4. Max Born Institut für Nichtlineare Optik und Kurzzeitspektroskopie, 12489 Berlin, Germany

5. Helmholtz-Zentrum Berlin für Materialien und Energie, 14109 Berlin, Germany

Funder

CALIPSOplus

Centre National de la Recherche Scientifique

Publisher

AIP Publishing

Subject