Effect of residual stress on the ferroelectric property of (Pb0.90La0.10)Ti0.975O3 thin films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.3079510
Reference12 articles.
1. Ferroelectric Memories
2. The Physics of Ferroelectric Memories
3. Growth and properties of (Pb0.90La0.10)TiO3 thick films prepared by RF magnetron sputtering with a PbO buffer layer
4. Microwave characterization of (Pb,La)TiO3 thin films integrated on ZrO2∕SiO2∕Si wafers by sol-gel techniques
5. Effect of the PbOx thickness on the microstructure and electrical properties of PLT thin films prepared by RF magnetron sputtering
Cited by 4 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Domain evolution of tetragonal Pb(ZrxTi1−x) O3 piezoelectric thin films on SrTiO3 (100) surfaces: combined effects of misfit strain and Zr/Ti ratio;J. Mater. Chem. C;2014
2. THICKNESS-DEPENDENCE OF RESIDUAL STRESS IN LEAD-FREE FERROELECTRIC K0.5Na0.5NbO3 FILMS;Journal of Advanced Dielectrics;2012-10
3. Temperature field and residual stress analysis of multilayer pyroelectric thin film;Ceramics International;2012-03
4. X-ray diffraction stress analysis of ferroelectric thin films with ideal (hkl) textures considering the piezoelectric coupling effect;Physica B: Condensed Matter;2010-02
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3