On the calculation of the geometric factor in a van der Pauw sheet resistance measurement-Reference-Cited by-同舟云学术

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On the calculation of the geometric factor in a van der Pauw sheet resistance measurement

Published:2000 Issue:10 Volume:71 Page:3964
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Rev. Sci. Instrum.

Author:

Chan Winston K.

Publisher

AIP Publishing

Subject

Instrumentation

Reference3 articles.

1. Extension of van der Pauw's theorem for measuring specific resistivity in discs of arbitrary shape to anisotropic media

2. On the Van der Pauw method of resistivity measurements

Cited by 12 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. On the physical meaning of the geometric factor and the effective thickness in the Montgomery method;AIP Advances;2024-02-01

2. A short account of thermoelectric film characterization techniques;Materials Today Physics;2023-08

3. On the Truncation of Series for the Electrical Current Flow in Rectangular Conducting Sheets;Brazilian Journal of Physics;2022-10-20

4. Easy and computer-time-saving implementation of the van der Pauw method including anisotropy and probe positioning correction factors using approximate closed-form analytical functions;Review of Scientific Instruments;2022-05-01

5. Electrical and thermodynamic study of SrTiO3 reduction using the van der Pauw method;Materials Chemistry and Physics;2021-04

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