Variable angle of incidence spectroscopic ellipsometric characterization of TiO2/Ag/TiO2optical coatings
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.342491
Reference11 articles.
1. Structure‐related optical properties of thin films
2. Ellipsometric measurements of molecular‐beam‐epitaxy‐grown semiconductor multilayer thicknesses: A comparative study
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4. Investigation of effective-medium models of microscopic surface roughness by spectroscopic ellipsometry
5. Variable angle of incidence spectroscopic ellipsometry: Application to GaAs‐AlxGa1−xAs multiple heterostructures
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