Nanosecond Microscopic Kerr Magneto‐Optic Apparatus and Measurement Techniques-Reference-Cited by-同舟云学术

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Nanosecond Microscopic Kerr Magneto‐Optic Apparatus and Measurement Techniques

Published:1968-05 Issue:5 Volume:39 Page:733-741
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Genovese E. R.,Chang H.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1683487

Reference19 articles.

1. Determination of Magnetization Distribution in Thin Films Using Electron Microscopy

2. Domain Walls in Thin Ni–Fe Films

3. Domain‐Wall Structures in Magnetic Double Films

Cited by 3 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Interactions in Multilayer Magnetic Films;Physics of Thin Films - Advances in Research and Development;1971

2. A Nanosecond Kerr Magneto‐Optic Camera;Review of Scientific Instruments;1969-06

3. Dynamic Magnetization Spread in Thin Magnetic Films;Journal of Applied Physics;1969-03

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