A new method for determining thin‐film refractive index and thickness using guided optical waves
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.89928
Reference10 articles.
1. Laser coupling: A new technique for measurement of refractive index and thickness of oxide and nitride films on silicon
2. MODES OF PROPAGATING LIGHT WAVES IN THIN DEPOSITED SEMICONDUCTOR FILMS
3. Measurement of Thin Film Parameters with a Prism Coupler
4. Light Waves in Thin Films and Integrated Optics
5. Metal-Clad Optical Waveguides: Analytical and Experimental Study
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