Author:
Ziegler James F.,Baglin John E. E.
Subject
General Physics and Astronomy
Cited by
68 articles.
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1. Self-consistent ion beam analysis: An approach by multi-objective optimization;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2021-11
2. Oxygen depth profiling by resonant backscattering and glow discharge optical emission spectroscopy of Ti-6Al-4V alloy oxidized by ion implantation and plasma based treatment;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2016-10
3. Status of ion beam data analysis and simulation software;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2006-03
4. Rutherford Backscattering Spectroscopy;Encyclopedia of Materials: Science and Technology;2001
5. Simulated annealing analysis of Rutherford backscattering data;Applied Physics Letters;1997-07-14