CN spectroscopy and physico–chemistry in the boundary layer of a C/SiC tile in a low pressure nitrogen/carbon dioxide plasma flow
Author:
Publisher
AIP Publishing
Subject
Physical and Theoretical Chemistry,General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.481682
Reference16 articles.
1. Structure of the atmosphere of Mars in summer at mid-latitudes
2. Review of chemical-kinetic problems of future NASA missions. II - Mars entries
3. Recommendations from the raden data base for the electronic transition moments on diatomic molecules of astrophysical interest. I: C2, CH, and CN molecules
4. TheA 2Π–X 2Σ+red andB 2Σ+–X 2Σ+violet systems of the CN radical: Accurate multireference configuration interaction calculations of the radiative transition probabilities
5. Fourier transform jet emission spectroscopy of the B2Σ+-X2Σ+ transition of CN
Cited by 17 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Graphite Ablation and Radiation on Interaction with Hypervelocity Earth-Entry Flows;Journal of Thermophysics and Heat Transfer;2021-04
2. Inference Methods for Gas-Surface Interaction Models: From Deterministic Approaches to Bayesian Techniques;Advances in Uncertainty Quantification and Optimization Under Uncertainty with Aerospace Applications;2021
3. Determination of active nitridation reaction efficiency of graphite in inductively coupled plasma flows;Carbon;2017-12
4. Characterization of laser-induced plasmas as a complement to high-explosive large-scale detonations;AIP Advances;2017-09
5. Emission Spectroscopic Boundary Layer Investigation during Ablative Material Testing in Plasmatron;Journal of Visualized Experiments;2016-06-09
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3