Surface roughness characterization of plasma textured polycrystalline silicon solar wafer with the laser speckle technique
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Publisher
AIP Publishing
Link
http://aip.scitation.org/doi/pdf/10.1063/5.0019445
Reference18 articles.
1. Ying Huang, NasimSahraei, PerI. Widenborg, IanMariusPeters, Goutam KumarDalapati, AneesaIskander, ArminG. Aberle. Solar EnergyMaterials&SolarCells. 122, 146–151,(2014).
2. Fractal analysis and atomic force microscopy measurements of surface roughness for Hastelloy C276 substrates and amorphous alumina buffer layers in coated conductors
3. Investigation of interface in silicon-on-insulator by fractal analysis
4. Fractal analysis of engineering ceramics ground surface
5. A comparative study of correlation methods for determination of fractal parameters in surface characterization
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