A current transient method for trap analysis in BiFeO3 thin films
Author:
Affiliation:
1. Faculty of Information Technology, School of Microelectronics, Beijing University of Technology, Beijing 100124, People's Republic of China
2. College of Microelectronics, Fudan University, Shanghai 200433, People's Republic of China
Funder
Scientific Research Project of Beijing Educational Committee
National Natural Science Foundation of China
Beijing Postdoctoral Research Foundation
Natural Science Foundation of Beijing Municipality
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.5025424
Reference26 articles.
1. An overview of the switching parameter variation of RRAM
2. Improved high-temperature switching characteristics of Y2 O3 /TiO x resistive memory through carrier depletion effect
3. Effect of carrier trapping on the hysteretic current-voltage characteristics inAg∕La0.7Ca0.3MnO3∕Ptheterostructures
4. Nonvolatile bipolar resistive switching behavior of epitaxial NdFeO3–PbTiO3thin films grown on Nb:SrTiO3(001) substrate
5. Flexible Hybrid Organic–Inorganic Perovskite Memory
Cited by 12 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Write-once-read-many-times memory device based on Pt/BiFeO3/LaNiO3 heterostructures;Applied Surface Science;2023-05
2. Trap characteristics of hafnium oxide-based ferroelectric field-effect transistors measured by using a current transient method;Applied Physics Letters;2023-03-13
3. Effects of Static and Repetitive Uniaxial Bending Strains on the Electrical Properties and Trap Characteristics of Flexible Low-Temperature Polysilicon Thin-Film Transistors;IEEE Transactions on Electron Devices;2023-02
4. Wake-up effect in Hf0.4Zr0.6O2 ferroelectric thin-film capacitors under a cycling electric field;Chinese Physics B;2022-07-01
5. Study of traps in low-temperature polysilicon thin film transistors using a current transient method;Semiconductor Science and Technology;2021-11-26
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3