Observation of enhanced epsilon-near-zero effects in resonant stratified media

Author:

Calpe Roman1ORCID,Karvinen Petri1ORCID,Pääkkönen Pertti1,Ornigotti Marco2ORCID,Caglayan Humeyra2ORCID,Turunen Jari1ORCID,Hakala Tommi K.1ORCID,Koivurova Matias1ORCID

Affiliation:

1. Center for Photonics Sciences, University of Eastern Finland 1 , P.O. Box 111, FI-80101 Joensuu, Finland

2. Faculty of Engineering and Natural Sciences, Tampere University 2 , 33720 Tampere, Finland

Abstract

Epsilon-near-zero (ENZ) materials have gained recent interest due to their exotic optical properties, but their potential is limited by intrinsic material losses. Enhanced epsilon-near-zero (eENZ) materials are periodically stratified media consisting of alternating ENZ and dielectric layers. In this study, we demonstrate the fabrication and optical characterization of 15-layer ENZ-dielectric thin film stack, wherein indium tin oxide functions as the ENZ material and titanium dioxide as the dielectric. We experimentally show the enhanced optical transmission of the structure over a bare ENZ film with similar thickness. Further, we display the giant polarization dependent optical response of the material, which is characterized by the narrowing from 56° to 14° in half-width at half-maximum of the transmission cone. These properties are physically attributed to guided-waves, Fabry–Pérot resonances, and Ferrell–Berreman plasmons within the film stack. The experimental realization of our material paves the way for devices utilizing eENZ-materials, such as coherence switchable lasers and light sources with directional emission.

Funder

Research Council of Finland

Publisher

AIP Publishing

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