In situ spectroscopic ellipsometry as a pathway toward achieving VO2 stoichiometry for amorphous vanadium oxide with magnetron sputtering-Reference-Cited by-同舟云学术

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In situ spectroscopic ellipsometry as a pathway toward achieving VO2 stoichiometry for amorphous vanadium oxide with magnetron sputtering

Published:2021-03-01 Issue:3 Volume:11 Page:035126
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Xu C.¹^ORCID,Heinemeyer F.¹^ORCID,Dittrich A.¹^ORCID,Bäumer C.²³^ORCID,Reineke-Koch R.¹^ORCID

Affiliation:

1. Institute for Solar Energy Research Hamelin (ISFH), Am Ohrberg 1, 31860 Emmerthal, Germany

2. Peter-Gruenberg Institute 7 and JARA-FIT, Forschungszentrum Juelich, 52428 Juelich, Germany

3. MESA+ Institute for Nanotechnology, University of Twente, Faculty of Science and Technology, 7500 AE Enschede, The Netherlands

Funder

Bundesministerium für Wirtschaft und Energie

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

https://aip.scitation.org/doi/pdf/10.1063/5.0041116

Reference27 articles.

1. Advances in thermochromic vanadium dioxide films

2. Opportunities in vanadium-based strongly correlated electron systems

3. Thermochromic VO2 for Energy-Efficient Smart Windows

4. Review on thermochromic vanadium dioxide based smart coatings: from lab to commercial application

5. Innovative Smart Selective Coating to Avoid Overheating in Highly Efficient Thermal Solar Collectors

Cited by 2 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Tracking optical properties of VO films to optimize polycrystalline VO2 fabrication;Thin Solid Films;2024-06

2. Four-parameter model of thin surface layer contribution to reflectance-absorbance spectroscopy and ellipsometry;Optics Express;2024-02-08

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