Simulated admittance spectroscopy measurements of high concentration deep level defects in CdTe thin-film solar cells
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2220491
Reference14 articles.
1. Characterization of CdS/CdTe thin‐film solar cells by admittance spectroscopy and deep‐level transient spectroscopy
2. DLTS and admittance measurements on CdS/CdTe solar cells
3. Thermal admittance spectroscopy study: preliminary observations of a Meyer-Neldel relationship in CdTe devices
4. Cu and CdCl2 influence on defects detected in CdTe solar cells with admittance spectroscopy
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