Direct measurements of the velocity and thickness of ‘‘explosively’’ propagating buried molten layers in amorphous silicon
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.96918
Reference16 articles.
1. Measurement of the Velocity of the Crystal-Liquid Interface in Pulsed Laser Annealing of Si
2. Silicon Melt, Regrowth, and Amorphization Velocities During Pulsed Laser Irradiation
3. Melting Temperature and Explosive Crystallization of Amorphous Silicon during Pulsed Laser Irradiation
4. Thermodynamic and Kinetic Studies of Pulsed-Laser Annealing from Transient Conductivity Measurements
5. Pulsed-Laser Melting of Amorphous Silicon: Time-Resolved Measurements and Model Calculations
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