Near field probe microscopy of porous silicon: Observation of spectral shifts in photoluminescence of small particles-Reference-Cited by-同舟云学术

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Near field probe microscopy of porous silicon: Observation of spectral shifts in photoluminescence of small particles

Published:1995-06-12 Issue:24 Volume:66 Page:3260-3262
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Rogers J. K.,Seiferth F.,Vaez‐Iravani M.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.113397

Reference20 articles.

Cited by 27 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Microscopy of Porous Silicon;Handbook of Porous Silicon;2018

2. Microscopy of Porous Silicon;Handbook of Porous Silicon;2016

3. Microscopy of Porous Silicon;Handbook of Porous Silicon;2014

4. Microscopy of Porous Silicon;Handbook of Porous Silicon;2014

5. Near-field spectroscopy of porous silicon microcavity samples;Journal of Applied Physics;2002-04-15

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