Local crystal analysis using near-field optical second harmonic microscopy: Application to thin ferroelectric films
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1331342
Reference17 articles.
1. Optical characterisation of semiconductor surfaces and interfaces
2. A combined nonlinear and linear magneto-optical microscopy
3. Static and high-frequency electric fields in silicon MOS and MS structures probed by optical second-harmonic generation
4. The Physics of Ferroelectric Memories
5. Near-field second harmonic imaging of lead zirconate titanate piezoceramic
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3. Probing Ferroelectrics Using Optical Second Harmonic Generation;Journal of the American Ceramic Society;2011-08-18
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