Microwave reflectometry diagnostic for density profile and fluctuation measurements on ASDEX Upgrade-Reference-Cited by-同舟云学术

Microwave reflectometry diagnostic for density profile and fluctuation measurements on ASDEX Upgrade

Published:1999-01 Issue:1 Volume:70 Page:1072-1075
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Silva A.,Cupido L.,Manso M.,Serra F.,Nunes I.,Santos J.,Varela P.,Vergamota S.,Meneses L.,Grossman V.,Silva F.,Loureiro C.,Nunes F.,Kurzan B.,Suttrop W.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1149439

Reference2 articles.

1. Ultrafast broadband frequency modulation of a continuous wave reflectometry system to measure density profiles on ASDEX Upgrade

2. H-mode studies with microwave reflectometry on ASDEX Upgrade

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