Measurement of thickness of annular liquid films based on distortion correction of laser-induced fluorescence imaging

Author:

Xue Ting1,Li Zhuolin1,Li Chenyang1,Wu Bin2

Affiliation:

1. Tianjin Key Laboratory of Process Measurement and Control, College of Electrical and Information Engineering, Tianjin University, Tianjin 300072, China

2. State Key Laboratory of Precision Measuring Technology and Instruments, Tianjin University, Tianjin 300072, China

Funder

National Natural Science Foundation of China

Natural Science Foundation of Tianjin City

Publisher

AIP Publishing

Subject

Instrumentation

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1. A Dual-sided PLIF40 Method to Mitigate the Impact of Total Reflection in Liquid Film Imaging;2024 IEEE International Instrumentation and Measurement Technology Conference (I2MTC);2024-05-20

2. Calibration of absorption coefficients of liquid solutions for measuring liquid film thickness by absorptiometry;Measurement Science and Technology;2024-05-08

3. Imaging and investigation with PLIF40 for improved film thickness measurements in annular flow;Experimental Thermal and Fluid Science;2024-01

4. Measurement of 3-D Characteristics of Falling Liquid Film Based on SLIF;IEEE Transactions on Instrumentation and Measurement;2024

5. An Interface Velocity Measurement Method of Liquid Film Based on SLIF;IEEE Transactions on Instrumentation and Measurement;2024

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