Calibration of binding energy and clarification of interfacial band bending for the Al2O3/diamond heterojunction

Author:

Liu J. W.1ORCID,Teraji T.1ORCID,Da B.2ORCID,Koide Y.1ORCID

Affiliation:

1. Research Center for Electronic and Optical Materials, National Institute for Materials Science (NIMS) 1 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

2. Research and Services Division of Materials Data and Integrated System, NIMS 2 , 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan

Abstract

Due to the presence of an intrinsic C 1s peak in diamond, it is impossible to calibrate its binding energies using the adventitious C 1s peak (284.8 eV) during x-ray photoelectron spectroscopy measurement. The absence of accurate binding energy measurement makes it challenging to determine the interfacial band bending for the oxide/diamond heterojunction. To overcome this issue, a net-patterned gold (Au) mask is applied to the boron-doped diamond (B-diamond) to suppress the charge-up effect and calibrate the binding energy using the standard Au 4f peak (83.96 eV). The B-diamond epitaxial layer shows downward band bending toward the surface with a valence band maximum of 0.85 eV. Upon the formation of Al2O3 using an ozone precursor through the atomic layer deposition technique, the B-diamond continues to exhibit downward band bending toward the Al2O3/B-diamond interface. However, the bending energy has reduced, potentially attributed to the modification of the oxygen vacancies on the B-diamond surface by the ozone precursor during the Al2O3 deposition.

Funder

Japan Society for the Promotion of Science London

Ministry of Education, Culture, Sports, Science and Technology

Core Research for Evolutional Science and Technology

Japan Science and Technology Agency

Publisher

AIP Publishing

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