Conduction band structure of GexSi1−xusing spatially resolved electron energy‐loss scattering
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.105707
Reference13 articles.
1. Near-band-gap photoluminescence of Si-Ge alloys
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4. Anomalous strain relaxation in SiGe thin films and superlattices
5. Parallel detection for high‐resolution electron energy loss studies in the scanning transmission electron microscope
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