Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy-Reference-Cited by-同舟云学术

Thickness dependent electronic structure of La0.6Sr0.4MnO3 layer in SrTiO3/La0.6Sr0.4MnO3/SrTiO3 heterostructures studied by hard x-ray photoemission spectroscopy

Published:2009-02-16 Issue:7 Volume:94 Page:071901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Yoshimatsu K.,Horiba K.,Kumigashira H.,Ikenaga E.,Oshima M.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3081016

Reference20 articles.

1. Engineered Interface of Magnetic Oxides

2. Electrical-field control of metal–insulator transition at room temperature in Pb(Zr0.2Ti0.8)O3/La1−xBaxMnO3 field-effect transistor

3. Metal-insulator transitions

4. Insulator-metal transition induced by interlayer coupling inLa0.6Sr0.4MnO3/SrTiO3superlattices

5. Inherent charge transfer layer formation at La0.6Sr0.4FeO3∕La0.6Sr0.4MnO3 heterointerface

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