Components of channel capacitance in metal-insulator-semiconductor capacitors
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.4821835
Reference29 articles.
1. Nanometre-scale electronics with III–V compound semiconductors
2. Physics of Semiconductor Devices
3. Comparison of methods to quantify interface trap densities at dielectric/III-V semiconductor interfaces
4. Accumulation capacitance of narrow band gap metal-oxide-semiconductor capacitors
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