Evidence for the existence of a metal-insulator-semiconductor junction at the electrode interfaces of CaCu3Ti4O12 thin film capacitors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2814043
Reference18 articles.
1. High Dielectric Constant in ACu3Ti4O12 and ACu3Ti3FeO12 Phases
2. Giant dielectric constant response in a copper-titanate
3. CaCu3Ti4O12: One-step internal barrier layer capacitor
4. Origin of apparent colossal dielectric constants
5. Nonintrinsic origin of the colossal dielectric constants inCaCu3Ti4O12
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