Determination of the third- and fifth-order nonlinear refractive indices in InN thin films
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2813637
Reference30 articles.
1. Femtosecond Z-scan measurement of GaN
2. Picosecond Z-scan measurements on bulk GaN crystals
3. Ultrafast third-harmonic generation from textured aluminum nitride–sapphire interfaces
4. Optical bleaching effect in InN epitaxial layers
5. Sensitive measurement of optical nonlinearities using a single beam
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3. Spectral dependence of third-order nonlinear optical properties in InN;Applied Physics Letters;2014-05-19
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