Voltage-gated spin-orbit torque switching in IrMn-based perpendicular magnetic tunnel junctions

Author:

Lu Jiaqi12ORCID,Li Weixiang23ORCID,Liu Jiahao1ORCID,Liu Zhaochun1ORCID,Wang Yining1ORCID,Jiang Congzheng1,Du Jiabo1,Lu Shiyang1,Lei Na1ORCID,Peng Shouzhong12ORCID,Zhao Weisheng12ORCID

Affiliation:

1. Fert Beijing Institute, School of Integrated Circuit Science and Engineering, Beijing Advanced Innovation Center for Big Data and Brain Computing, Beihang University 1 , Beijing 100191, China

2. Hefei Innovation Research Institute, Beihang University 2 , Hefei 230013, China

3. Department of Electrical Engineering, Beihang University 3 , Beijing 100191, China

Abstract

In this work, IrMn-based perpendicular magnetic tunnel junctions (MTJs) are investigated. By inserting a thin W layer at an antiferromagnet/ferromagnet (AFM/FM) interface, we enhance the annealing temperature to 355 °C and obtain a high tunnel magnetoresistance ratio of 127%. Subsequently, field-free spin–orbit torque (SOT) switching of perpendicular MTJ is realized thanks to the in-plane exchange bias generated at the AFM/FM interface. Moreover, by applying a gate voltage, a coercive field is effectively decreased due to the voltage-controlled magnetic anisotropy (VCMA) effect. Finally, through the interplay of the SOT and VCMA effects, the critical switching current density is dramatically reduced by 73% (to 2.4 MA/cm2) and the total writing power consumption is decreased by 84% when a gate voltage of 0.76 V is applied. These findings pave the way for the practical applications of the IrMn-based perpendicular MTJs in low-power magnetic random-access memory.

Funder

National Natural Science Foundation of China

Fundamental Research Funds for the Central Universities

Young Elite Scientists Sponsorship by CAST

National Key Research and Development Program of China

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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