Frequency-modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam deflection method
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.2149004
Reference24 articles.
1. Atomic force microscope–force mapping and profiling on a sub 100‐Å scale
2. Tapping-Mode Atomic Force Microscopy Produces Faithful High-Resolution Images of Protein Surfaces
3. High-Resolution Imaging of Antibodies by Tapping-Mode Atomic Force Microscopy: Attractive and Repulsive Tip-Sample Interaction Regimes
4. True molecular resolution in tapping-mode atomic force microscopy with high-resolution probes
5. Frequency modulation detection using high‐Qcantilevers for enhanced force microscope sensitivity
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