Defect states of amorphous Si probed by the diffusion and solubility of Cu
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.103493
Reference15 articles.
1. Calorimetric evidence for structural relaxation in amorphous silicon
2. Homogeneous and interfacial heat releases in amorphous silicon
3. Transient structural relaxation of amorphous silicon
4. Thermodynamic and Structural Properties of Mev Ion Beam Amorphized Silicon
5. Determination of the energy barrier for structural relaxation in amorphous Si and Ge by Raman scattering
Cited by 52 articles. 订阅此论文施引文献 订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献
1. Understanding Defects in Amorphous Silicon with Million‐Atom Simulations and Machine Learning;Angewandte Chemie International Edition;2024-04-18
2. Understanding Defects in Amorphous Silicon with Million‐Atom Simulations and Machine Learning;Angewandte Chemie;2024-04-18
3. Silicon compatible Sn-based resistive switching memory;Nanoscale;2018
4. Diffusion and aggregation process of oxygen embedded around an amorphous/crystal interface of Si(001) studied by molecular dynamics simulation;Journal of Applied Physics;2017-05-14
5. Quantification of the Void Volume in Single-Crystal Silicon;Analytical Chemistry;2016-11-08
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线，采集、加工和组织学术论文而形成的新型学术文献查询和分析系统，可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容，当前同舟云学术共收录了国内外主流学术期刊6万余种，收集的期刊论文及会议论文总量共计约1.5亿篇，并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询！咨询电话：010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3