Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation-Reference-Cited by-同舟云学术

Removing interference and optical feedback artifacts in atomic force microscopy measurements by application of high frequency laser current modulation

Published:2004-03 Issue:3 Volume:75 Page:689-693
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Kassies Roel,van der Werf Kees O.,Bennink Martin L.,Otto Cees

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1646767

Reference10 articles.

1. Novel optical approach to atomic force microscopy

2. Optical interference artifacts in contact atomic force microscopy images

3. Compact stand‐alone atomic force microscope

4. Measuring adhesion, attraction, and repulsion between surfaces in liquids with an atomic-force microscope

5. AFM and TEM investigations of polypropylene/polyurethane blends

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