Use of SF6− for Calibration of the Electron Energy Scale
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1735773
Reference5 articles.
1. Electron Attachment in Sulfur Hexafluoride Using Monoenergetic Electrons
2. Electron Impact Study of Nitric Oxide Using a Modified Retarding Potential Difference Method
3. Measurement of Excitation ofN2, CO, and He by Electron Impact
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1. High-resolution electron attachment to the molecules CCl4and SF6over extended energy ranges with the (EX)LPA method;Journal of Physics B: Atomic, Molecular and Optical Physics;2009-05-26
2. Electron ionization time-of-flight mass spectrometry: Historical review and current applications;Mass Spectrometry Reviews;2008
3. Studies of low-energy electron attachment at surfaces;International Journal of Mass Spectrometry;2001-02
4. Ionisation by electron impact of phosphorus trifluoride and difluorocyanophosphine;International Journal of Mass Spectrometry and Ion Physics;1974-04
5. Negative ion mass spectrometry;Chemical Reviews;1973-12
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