Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions-Reference-Cited by-同舟云学术

Observation by conductive-probe atomic force microscopy of strongly inverted surface layers at the hydrogenated amorphous silicon/crystalline silicon heterojunctions

Published:2010-12-20 Issue:25 Volume:97 Page:252110
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Maslova O. A.,Alvarez J.,Gushina E. V.,Favre W.,Gueunier-Farret M. E.,Gudovskikh A. S.,Ankudinov A. V.,Terukov E. I.,Kleider J. P.

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3525166

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