Double Grid Repeller System to Improve Electron Resolution in Low Energy Electron Diffraction Equipment-Reference-Cited by-同舟云学术

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Double Grid Repeller System to Improve Electron Resolution in Low Energy Electron Diffraction Equipment

Published:1965-10 Issue:10 Volume:36 Page:1500-1501
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Caldwell C. W.

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.1719369

Cited by 24 articles. 订阅此论文施引文献订阅此论文施引文献，注册后可以免费订阅5篇论文的施引文献，订阅后可以查看论文全部施引文献

1. Ions;Experimental Innovations in Surface Science;2015

2. Chopped sample heating for quantitative profile analysis of low energy electron diffraction spots at high temperatures;Review of Scientific Instruments;2004-11

3. Growth of semiconductor layers studied by spot profile analysing low energy electron diffraction – Part II 1;Zeitschrift für Kristallographie - Crystalline Materials;1999-11-01

4. Pulse-Counting LEED/ESDIAD Analyzer—Using MicroChannel Plate Detection;Experimental Innovations in Surface Science;1998

5. 5. Diffraction Techniques;Methods in Experimental Physics;1985

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