Distribution of charge carriers generated in a semiconductor by a focused convergent light beam
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.336967
Reference5 articles.
1. Examination of grain boundaries in polycrystalline solar cells using a scanning optical microscope
2. A scanning optical microscope for the inspection of semiconductor materials and devices
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4. Phase Distribution near Focus in an Aberration-free Diffraction Image
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