Tip-gating effect in scanning impedance microscopy of nanoelectronic devices
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1531833
Reference12 articles.
1. Nanopotentiometry: Local potential measurements in complementary metal–oxide–semiconductor transistors using atomic force microscopy
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5. Scanning impedance microscopy of an active Schottky barrier diode
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