Self-sensing cantilevers with integrated conductive coaxial tips for high-resolution electrical scanning probe metrology

Author:

Haemmerli Alexandre J.1,Harjee Nahid2,Koenig Markus3,Garcia Andrei G. F.3,Goldhaber-Gordon David3,Pruitt Beth L.1ORCID

Affiliation:

1. Department of Mechanical Engineering, Stanford University, 440 Escondido Mall, Stanford, North Carolina 94305, USA

2. Department of Electrical Engineering, Stanford University, 350 Serra Mall, Stanford, North Carolina 94305, USA

3. Department of Physics, Stanford University, 382 Via Pueblo Mall, Stanford, North Carolina 94305, USA

Funder

National Science Foundation (NSF)

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Cited by 5 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献

1. Relative position calibration of multi-LDS in shaft center measurement system;2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems;2018-01-12

2. Nanoscale Transport Imaging of Active Lateral Devices: Static and Frequency Dependent Modes;Kelvin Probe Force Microscopy;2018

3. Large area fast-AFM scanning with active “Quattro” cantilever arrays;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-11

4. Six-axis AFM in SEM with self-sensing and self-transduced cantilever for high speed analysis and nanolithography;Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena;2016-11

5. De-embedding techniques for nanoscale characterization of semiconductors by scanning microwave microscopy;Microelectronic Engineering;2016-06

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