Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs-Reference-Cited by-同舟云学术

Thermal characterization of polycrystalline diamond thin film heat spreaders grown on GaN HEMTs

Published:2017-07-24 Issue:4 Volume:111 Page:041901
ISSN:0003-6951
Container-title:Applied Physics Letters
language:en
Short-container-title:Appl. Phys. Lett.

Author:

Zhou Yan¹,Ramaneti Rajesh²³,Anaya Julian¹,Korneychuk Svetlana⁴,Derluyn Joff⁵,Sun Huarui¹^ORCID,Pomeroy James¹^ORCID,Verbeeck Johan⁴,Haenen Ken²³^ORCID,Kuball Martin¹

Affiliation:

1. Center for Device Thermography and Reliability (CDTR), H. H. Wills Physics Laboratory, University of Bristol, Tyndall Avenue, Bristol BS8 1TL, United Kingdom

2. Institute for Materials Research (IMO), Hasselt University, Wetenschapspark 1, 3590 Diepenbeek, Belgium

3. IMOMEC, IMEC vzw, Wetenschapspark 1, 3590 Diepenbeek, Belgium

4. Electron Microscopy for Material Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp, Belgium

5. EpiGaN NV, Kempische Steenweg 293, 3500 Hasselt, Belgium

Funder

Defense Advanced Research Projects Agency (DARPA)

China Scholarship Council (CSC)

Publisher

AIP Publishing

Subject

Physics and Astronomy (miscellaneous)

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