Real-time synchrotoron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO2/Si substrates-Reference-Cited by-同舟云学术

Real-time synchrotoron radiation X-ray diffraction and abnormal temperature dependence of photoluminescence from erbium silicates on SiO2/Si substrates

Published:2012-03 Issue:1 Volume:2 Page:012141
ISSN:2158-3226
Container-title:AIP Advances
language:en
Short-container-title:AIP Advances

Author:

Omi H.,Tawara T.,Tateishi M.

Publisher

AIP Publishing

Subject

General Physics and Astronomy

Link

http://aip.scitation.org/doi/pdf/10.1063/1.3687419

Reference17 articles.

1. Er-based materials for Si microphotonics

2. Optical and structural properties of Er2O3 films grown by magnetron sputtering

3. Concentration dependence of the Er3+ visible and infrared luminescence in Y2−xErxO3 thin films on Si

4. Large-scale fabrication of single-phase Er2SiO5 nanocrystal aggregates using Si nanowires

5. The influence of stoichiometry on the structural stability and on the optical emission of erbium silicate thin films

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