B diffusion and clustering in ion implanted Si: The role of B cluster precursors
Author:
Publisher
AIP Publishing
Subject
Physics and Astronomy (miscellaneous)
Link
http://aip.scitation.org/doi/pdf/10.1063/1.118839
Reference9 articles.
1. Implantation and transient B diffusion in Si: The source of the interstitials
2. Trap‐limited interstitial diffusion and enhanced boron clustering in silicon
3. Carbon incorporation in silicon for suppressing interstitial‐enhanced boron diffusion
4. Point defects and dopant diffusion in silicon
5. Atomistic calculations of ion implantation in Si: Point defect and transient enhanced diffusion phenomena
Cited by 202 articles. 订阅此论文施引文献 订阅此论文施引文献,注册后可以免费订阅5篇论文的施引文献,订阅后可以查看论文全部施引文献
1. Impact of Sequential N Ion Implantation on Extended Defects and Mg Distribution in Mg Ion‐Implanted GaN;physica status solidi (RRL) – Rapid Research Letters;2024-04-22
2. Carrier-induced formation of electrically active boron-interstitial clusters in irradiated boron-doped silicon;Journal of Applied Physics;2024-02-01
3. Structural evolution, charge transfer and bonding properties of medium-sized atomic rubidium-doped boron clusters;New Journal of Chemistry;2023
4. Atomistic simulations of acceptor removal in p-type Si irradiated with neutrons;Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms;2022-02
5. Mechanism of creation and destruction of oxygen interstitial atoms by nonpolar zinc oxide(101̄0) surfaces;Physical Chemistry Chemical Physics;2021
1.学者识别学者识别
2.学术分析学术分析
3.人才评估人才评估
"同舟云学术"是以全球学者为主线,采集、加工和组织学术论文而形成的新型学术文献查询和分析系统,可以对全球学者进行文献检索和人才价值评估。用户可以通过关注某些学科领域的顶尖人物而持续追踪该领域的学科进展和研究前沿。经过近期的数据扩容,当前同舟云学术共收录了国内外主流学术期刊6万余种,收集的期刊论文及会议论文总量共计约1.5亿篇,并以每天添加12000余篇中外论文的速度递增。我们也可以为用户提供个性化、定制化的学者数据。欢迎来电咨询!咨询电话:010-8811{复制后删除}0370
www.globalauthorid.com
TOP
Copyright © 2019-2024 北京同舟云网络信息技术有限公司 京公网安备11010802033243号 京ICP备18003416号-3