Drift velocity comparison between high‐electron mobility transistors and doped‐channel field‐effect transistors at very small dimensions
Author:
Publisher
AIP Publishing
Subject
General Physics and Astronomy
Link
http://aip.scitation.org/doi/pdf/10.1063/1.340037
Reference9 articles.
1. A New Field-Effect Transistor with Selectively Doped GaAs/n-AlxGa1-xAs Heterojunctions
2. Large transconductance n+-Ge gate AlGaAs/GaAs MISFET with thin gate insulator
3. A high-current drivability i-AlGaAs/n-GaAs doped-channel MIS-Like FET (DMT)
4. Mobility enhancement in highly doped GaAs quantum wells
5. Monte Carlo study of electronic transport inAl1−xGaxAs/GaAs single-well heterostructures
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1. Comparison of 80-200 nm gate length Al/sub 0.25/GaAs/GaAs/(GaAs:AlAs), Al/sub 0.3/GaAs/In/sub 0.15/GaAs/GaAs, and In/sub 0.52/AlAs/In/sub 0.65/GaAs/InP HEMTs;IEEE Transactions on Electron Devices;1995
2. Molecular Beam Epitaxy — Fundamental Growth Aspects and Selected Contributions to Physics and Applications of Low-Dimensional Semiconductor Structures;Fabrication, Properties and Applications of Low-Dimensional Semiconductors;1995
3. An efficient and accurate self-consistent calculation of electronic states in modulation doped heterostructures;Solid-State Electronics;1994-01
4. A comparison between different numerical methods used to solve Poisson’s and Schroedinger’s equations in semiconductor heterostructures;Journal of Applied Physics;1993-09
5. An Efficient and Accurate Method to Calculate the Two-Dimensional Scattering Rates in Heterostructure Semiconductors;Simulation of Semiconductor Devices and Processes;1993
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