Force microscopy with a bidirectional capacitance sensor
Author:
Publisher
AIP Publishing
Subject
Instrumentation
Link
http://aip.scitation.org/doi/pdf/10.1063/1.1141354
Reference29 articles.
1. Atomic Force Microscope
2. Measurement of Micromechanical Properties Using Atomic Force Microscope with Capacitative
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4. Scanning tunneling microscope instrumentation
5. Scanning Tunneling Microscopy and Atomic Force Microscopy: Application to Biology and Technology
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