Note: Low-temperature scanning tunneling microscope with detachable scanner and reliable transfer mechanism for tip and sample exchange-Reference-Cited by-同舟云学术

Note: Low-temperature scanning tunneling microscope with detachable scanner and reliable transfer mechanism for tip and sample exchange

Published:2017-12 Issue:12 Volume:88 Page:126102
ISSN:0034-6748
Container-title:Review of Scientific Instruments
language:en
Short-container-title:Review of Scientific Instruments

Author:

Ge Weifeng¹^ORCID,Wang Jihao²,Wang Junting¹,Zhang Jing²^ORCID,Hou Yubin²^ORCID,Lu Qingyou¹²³

Affiliation:

1. Hefei National Laboratory for Physical Sciences at the Microscale, University of Science and Technology of China, Hefei, Anhui 230026, People’s Republic of China

2. Anhui Province Key Laboratory of Condensed Matter Physics at Extreme Conditions, High Magnetic Field Laboratory of the Chinese Academy of Sciences, Hefei, Anhui 230031, People’s Republic of China

3. Collaborative Innovation Center for Artificial Microstructure and Quantum Control, Nanjing University, Nanjing 210093, People’s Republic of China

Funder

National Natural Science Foundation of China

Publisher

AIP Publishing

Subject

Instrumentation

Link

http://aip.scitation.org/doi/pdf/10.1063/1.4997347

Reference9 articles.

1. Tunneling through a controllable vacuum gap

2. A stiff scanning tunneling microscopy head for measurement at low temperatures and in high magnetic fields